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Dehm / Howe / Zweck

In-situ Electron Microscopy

Medium: Buch
ISBN: 978-3-527-31973-2
Verlag: Wiley VCH Verlag GmbH
Erscheinungstermin: 26.04.2012
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Von den Grundlagen über das Experiment bis zur Anwendung zeigt dieses Buch, wie sich Ionenstrahlanlagen, Rasterelektronenmikroskope und Transmissionselektronenmikroskope zur Beobachtung von Phänomenen bis hinunter zum Nanomaßstab in Echtzeit einsetzen lassen. Nach einem theoretischen Überblick werden experimentelle Verfahren zur Untersuchung von Aufwachsprozessen, Schmelzen, chemischen Reaktionen und Dotierung besprochen; außerdem geht es um die Messung mechanischer, magnetischer, optischer und elektronischer Kenndaten. Der letzte Abschnitt widmet sich Fragen der Soft-Matter-Charakterisierung.Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

Produkteigenschaften

  • Artikelnummer: 9783527319732
  • Medium: Buch
  • ISBN: 978-3-527-31973-2
  • Verlag: Wiley VCH Verlag GmbH
  • Erscheinungstermin: 26.04.2012
  • Sprache(n): Englisch
  • Auflage: 1. Auflage 2012
  • Produktform: Gebunden
  • Gewicht: 908 g
  • Seiten: 384
  • Format (B x H x T): 170 x 240 x 24 mm
  • Ausgabetyp: Kein, Unbekannt

Themen

Autoren/Hrsg.

Herausgeber

Dehm, Gerhard

Professor Gerhard Dehm is the department head of Materials Physics at the Montanuniversität Leoben, Austria, and director of the Erich Schmid Institute of Materials Science from the Austrian Academy of Sciences. He has authored over 120 scientific publications and has received scientific awards from the German Society of Materials Science (DGM) and from the award for Nanosciences and Nanotechnology from the State of Styria (Austria).

Howe, James M.

Professor James M. Howe is Director of the Nanoscale Materials Characterization Facility in the Department of Materials Science and Engineering at the University of Virginia (USA). He has received several awards for his research, including a Senior Research Award from the von Humboldt Foundation (Germany), the Materials Science Research Silver Medal from ASM International, and the TMS Champion H. Mathewson Medal from TMS. He has published over 200 technical papers, two book chapters and two symposium proceedings. He is author of the textbook "Interfaces in Materials" and co-author of the textbook "Transmission Electron Microscopy and Diffractometry of Materials".

Zweck, Josef

Professor Josef Zweck is head of the electron microscopy group at the University of Regenburg's physics faculty (Germany). He is board member of Germany's society for electron microscopy (DGE) since 1996. he has authored well over 100 scientific publications and is referee for numerous scientific journals.

((short))
Basics
Thermodynamics
Mechanical Properties
Magnetic Properties
Optical Properties
Electronic Properties
Ferroelectric Properties
Soft Matter

((long))
I. Basics
Scanning Electron Microscopy (SEM)
Focused Ion Beam Microscopy (FIB)
Transmission Electron Microscopy (including HRTEM and STEM)
Camera Systems for Dynamic TEM Experiments
II. Thermodynamics
Growth Processes
Melting and Pre-melting
Chemical Reactions and Oxidation
Interface Kinetcs
Formation of Silicides from a-Si and metal layers
Formation of Surface Patterns observed by Reflection Electron Microscopy
III. Mechanical Properties
The FIB Platform
Mechanical Tests in the SEM
Strain Mapping by Image Correlation (SEM to HRTEM)
Dislocation Mechanisms
New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM
IV. Magnetic Properties
Lorentz-Microscopy
Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM
V. Optical Properties
Cathodoluminiscence in SEM and TEM
Optical Properties of Nanotubes
VI. Electronic Properties
EBIC (SEM) and Potential Contrast
Electromigration (SEM, TEM)
VII. Ferroelectric Properties
Ferroelectric Domains
VIII. Soft Matter
Experiments using Wet-cells (SEM, ESEM, biological samples and materials)
Structure Determination of Soft Matter using In-situ TechniquesPREFACE

PART I: Basics and Methods

INTRODUCTION TO SCANNING ELECTRON MICROSCOPY
Components of the Scanning Electron Microscope
Electron - Matter Interaction
Contrast Mechanisms
Electron Backscattered Diffraction (EBSD)
Dispersive X-Ray Spectroscopy
Other Signals
Summary

CONVENTIONAL AND ADVANCED ELECTRON TRANSMISSION MICROSCOPY
Introduction
High-Resolution Transmission Electron Microscopy
Conventional TEM of Defects in Crystals
Lorentz Microscopy
Off-Axis and Inline Electron Holography
Electron Diffraction Techniques
Convergent Beam Electron Diffraction
Scanning Transmission Electron Microscopy and Z-Contrast
Analytical TEM

DYNAMIC TRANSMISSION ELECTRON MICROSCOPY
Introduction
How Does Single-Shot DTEM Work?
Experimental Applications of DTEM
Crystallization Under Far-from-Equilibrium Conditions
Space Charge Effects in Single-Shot DTEM
Next-Generation DTEM
Conclusions

FORMATION OF SURFACE PATTERNS OBSERVED WITH REFLECTION ELECTRON MICROSCOPY
Introduction
Reflection Electron Microscopy
Silicon Substrate Preparation
Monatomic Steps
Step Bunching
Surface Reconstructions
Epitaxial Growth
Thermal Oxygen Etching
Conclusions

PART II Growth and Interactions

ELECTRON AND ION IRRADIATION
Introduction
The Physics of Irradiation
Radiation Defects in Solids
The Setup in the Electron Microscope
Experiments
Outlook

OBSERVING CHEMICAL REACTIONS USING TRANSMISSION ELECTRON MICROSCOPY
Introduction
Instrumentation
Types of Chemical Reaction Suitable for TEM Observation
Experimental Setup
Available Information Under Reaction Conditions
Limitations and Future Developments

IN-SITU TEM STUDIES OF VAPOR- AND LIQUID-PHASE CRYSTAL GROWTH
Introduction
Experimental Considerations
Vapor-Phase Growth Processes
Liquid-Phase Growth Processes
Summary

IN-SITU TEM STUDIES OF OXIDATION
Introduction
Experimental Approach
Oxidation Phenomena
Future Developments
Summary

PART III: Mechanical Properties

MECHANICAL TESTING WITH THE SCANNING ELECTRON MICROSCOPE
Introduction
Technical Requirements and Specimen Preparation
In-Situ Loading of Macroscopic Samples
In-Situ Loading of Micron-Sized Samples
Summary and Outlook

IN-SITU TEM STRAINING EXPERIMENTS: RECENT PROGRESS IN STAGES AND SMALL-SCALE MECHANICS
Introduction
Available Straining Techniques
Dislocation Mechanisms in Thermally Strained Metallic Films
Size-Dependent Dislocation Plasticity in Metals
Conclusions and Future Directions

IN-SITU NANOINDENTATION IN THE TRANSMISSION ELECTRON MICROSCOPE
Introduction
Experimental Methodology
Example Studies
Conclusions

PART IV: Physical Properties

CURRENT-INDUCED TRANSPORT: ELECTROMIGRATION
Principles
Transmission Electron Microscopy
Secondary Electron Microscopy
X-Radiography Studies
Specialized Techniques
Comparison of In-Situ Methods

CATHODOLUMINESCENCE IN SCANNING AND TRANSMISSION ELECTRON MICROSCOPIES
Introduction
Principles of Cathodoluminsecence
Applications of CL in Scanning and Transmission Electron Microscopies
Concluding Remarks

IN-SITU TEM WITH ELECTRICAL BIAS ON FERROELECTRIC OXIDES
Introduction
Experimental Details
Domain Polarization Switching
Grain Boundary Cavitation
Domain Wall Fracture
Antiferroelectric-to-Ferroelectric Phase Transition
Relaxor-to-Ferroelectric Phase Transition

LORENTZ MICROSCOPY
Introduction
The In-Situ Creation of Magnetic Fields
Examples
Problems
Conclusions