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Esseni / Palestri / Selmi

Nanoscale MOS Transistors

Medium: Buch
ISBN: 978-0-521-51684-6
Verlag: Cambridge University Press
Erscheinungstermin: 20.01.2011
Lieferfrist: bis zu 10 Tage
Written from an engineering standpoint, this book provides the theoretical background and physical insight needed to understand new and future developments in the modeling and design of n- and p-MOS nanoscale transistors. A wealth of applications, illustrations and examples connect the methods described to all the latest issues in nanoscale MOSFET design. Key areas covered include: • Transport in arbitrary crystal orientations and strain conditions, and new channel and gate stack materials • All the relevant transport regimes, ranging from low field mobility to quasi-ballistic transport, described using a single modeling framework • Predictive capabilities of device models, discussed with systematic comparisons to experimental results

Produkteigenschaften


  • Artikelnummer: 9780521516846
  • Medium: Buch
  • ISBN: 978-0-521-51684-6
  • Verlag: Cambridge University Press
  • Erscheinungstermin: 20.01.2011
  • Sprache(n): Englisch
  • Auflage: Erscheinungsjahr 2011
  • Produktform: Gebunden, HC gerader Rücken kaschiert
  • Gewicht: 1019 g
  • Seiten: 488
  • Format (B x H x T): 175 x 250 x 31 mm
  • Ausgabetyp: Kein, Unbekannt

Autoren/Hrsg.

Autoren

Esseni, David

David Esseni is an Associate Professor of Electronics at the University of Udine, Italy.

Palestri, Pierpaolo

Pierpaolo Palestri is an Associate Professor of Electronics at the University of Udine, Italy.

Selmi, Luca

Luca Selmi is a Professor of Electronics at the University of Udine, Italy.

1. Introduction; 2. Bulk semiconductors and the semi-classical model; 3. Quantum confined inversion layers; 4. Carrier scattering in silicon MOS transistors; 5. The Boltzmann transport equation; 6. The Monte Carlo method for the Boltzmann transport equation; 7. Simulation of bulk and SOI silicon MOSFETs; 8. MOS transistors with arbitrary crystal orientation; 9. MOS transistors with strained silicon channels; 10. MOS transistors with alternative materials; Appendix A. Mathematical definitions and properties; Appendix B. Integrals and transformations over a finite area A; Appendix C. Calculation of the equi-energy lines with the k-p model; Appendix D. Matrix elements beyond the envelope function approximation; Appendix E. Charge density produced by a perturbation potential.