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Haartman / Östling

Low-Frequency Noise in Advanced Mos Devices

Medium: Buch
ISBN: 978-1-4020-5909-4
Verlag: Springer Nature Singapore
Erscheinungstermin: 24.07.2007
Lieferfrist: bis zu 10 Tage
Low-Frequency Noise in Advanced CMOS Devices begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practical advice is given. The various theoretical and compact low-frequency (1/f) noise models in MOS transistors are treated extensively providing an in-depth understanding of the low-frequency noise mechanisms and the potential sources of the noise in MOS transistors. Advanced CMOS technology including nanometer scaled devices, strained Si, SiGe, SOI, high-k gate dielectrics, multiple gates and metal gates are discussed from a low-frequency noise point of view. Some of the most recent publications and conference presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits.

Produkteigenschaften


  • Artikelnummer: 9781402059094
  • Medium: Buch
  • ISBN: 978-1-4020-5909-4
  • Verlag: Springer Nature Singapore
  • Erscheinungstermin: 24.07.2007
  • Sprache(n): Englisch
  • Auflage: 2007. Auflage 2007
  • Serie: Analog Circuits and Signal Processing
  • Produktform: Gebunden
  • Gewicht: 1120 g
  • Seiten: 216
  • Format (B x H x T): 165 x 246 x 24 mm
  • Ausgabetyp: Kein, Unbekannt

Autoren/Hrsg.

Autoren

Haartman, Martin

Östling, Mikael

Authors. Preface. Acknowledgments. Chapter 1 Fundamental noise mechanisms. Chapter 2 Noise characterization. Chapter 3 1/f noise in MOSFETs - origins and modelling. Chapter 4 1/f Noise performance of advanced CMOS devices. Chapter 5 Introduction to noise in RF/analog circuits. Appendix I List of Symbols. Appendix II List of Acronyms. Appendix III Solutions to problems. Index.