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Hawkes

Advances in Imaging and Electron Physics

Volume 156

Medium: Buch
ISBN: 978-0-12-374762-4
Verlag: Elsevier Health Sciences
Erscheinungstermin: 01.04.2009
Lieferfrist: bis zu 10 Tage
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Produkteigenschaften


  • Artikelnummer: 9780123747624
  • Medium: Buch
  • ISBN: 978-0-12-374762-4
  • Verlag: Elsevier Health Sciences
  • Erscheinungstermin: 01.04.2009
  • Sprache(n): Englisch
  • Auflage: Erscheinungsjahr 2009
  • Produktform: Gebunden
  • Gewicht: 703 g
  • Seiten: 376
  • Format (B x H x T): 155 x 226 x 23 mm
  • Ausgabetyp: Kein, Unbekannt

Autoren/Hrsg.

Herausgeber

Hawkes, Peter W

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

1.Photometric Stereo: an overview, M. Petrou, A. Vasileios
2. The Fourier Transform in Clifford Analysis, F. Brackx, N. De Schepper, F. Sommen
3. Carbon nanotube electron sources for electron microscopes, N. de Jonge
4. Localized Waves: A Review, E. Recami, M. Zamboni-Rached