Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.
Produkteigenschaften
- Artikelnummer: 9780780310001
- Medium: Buch
- ISBN: 978-0-7803-1000-1
- Verlag: Wiley
- Erscheinungstermin: 10.09.2002
- Sprache(n): Englisch
- Auflage: 1. Auflage 2002
- Produktform: Gebunden
- Gewicht: 1085 g
- Seiten: 480
- Format (B x H x T): 183 x 260 x 30 mm
- Ausgabetyp: Kein, Unbekannt