This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry.;Examing every important aspect of the field, Speckle Metrology: surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems.;With over 1500 literature citations, tables, figures and display equations, Speckle Metrology is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Produkteigenschaften
- Artikelnummer: 9780824789329
- Medium: Buch
- ISBN: 978-0-8247-8932-9
- Verlag: Taylor and Francis
- Erscheinungstermin: 20.05.1993
- Sprache(n): Englisch
- Auflage: 1. Auflage 1993
- Serie: Optical Science and Engineering
- Produktform: Gebunden
- Gewicht: 857 g
- Seiten: 572
- Format (B x H x T): 158 x 232 x 31 mm
- Ausgabetyp: Kein, Unbekannt